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X-ray line profile analysis in mater...
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IGI Global
X-ray line profile analysis in materials science
紀錄類型:
書目-語言資料,印刷品 : 單行本
作者:
GubiczaJeno, 1969-
其他團體作者:
IGI Global
面頁冊數:
PDFs (343 pages)
標題:
X-ray crystallography. -
標題:
Applications of X-ray line profile analysis
標題:
Crystallite size broadening of diffraction line profiles
標題:
Evaluation methods of line profiles
標題:
Influence of chemical heterogeneities
標題:
Kinematical X-ray scattering theory
標題:
Line profiles caused by planar faults
標題:
Peak profile evaluation for thin films
標題:
Strain broadening of X-ray diffractional peaks
標題:
X-ray line profile analysis for single crystals
電子資源:
http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-5852-3
附註:
Content Type: text
摘要註:
"X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis"--Provided by publisher.
ISBN:
9781466658530
內容註:
Fundamentals of kinematical X-ray scattering theory Crystallite size broadening of diffraction line profiles Strain broadening of X-ray diffraction peaks Line profiles caused by planar faults Influence of chemical heterogeneities on line profiles Evaluation methods of line profiles Peak profile evaluation for thin films X-ray line profile analysis for single crystals Practical applications of X-ray line profile analysis.
X-ray line profile analysis in materials science
Gubicza, Jeno
X-ray line profile analysis in materials science
/ Jeno Gubicza. - PDFs (343 pages).
Fundamentals of kinematical X-ray scattering theory.
Content Type: textMedia type: electronicCarrier type: online resourceRestricted to subscribers or individual electronic text purchasers..
Includes bibliographical references and index..
ISBN 9781466658530ISBN 9781466658523ISBN 1466658525
X-ray crystallography.
Applications of X-ray line profile analysisCrystallite size broadening of diffraction line profilesEvaluation methods of line profilesInfluence of chemical heterogeneitiesKinematical X-ray scattering theoryLine profiles caused by planar faultsPeak profile evaluation for thin filmsStrain broadening of X-ray diffractional peaksX-ray line profile analysis for single crystals
X-ray line profile analysis in materials science
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Fundamentals of kinematical X-ray scattering theory
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Crystallite size broadening of diffraction line profiles
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Strain broadening of X-ray diffraction peaks
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Line profiles caused by planar faults
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Influence of chemical heterogeneities on line profiles
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Evaluation methods of line profiles
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Peak profile evaluation for thin films
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X-ray line profile analysis for single crystals
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Practical applications of X-ray line profile analysis.
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"X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis"--Provided by publisher.
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Applications of X-ray line profile analysis
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Crystallite size broadening of diffraction line profiles
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Evaluation methods of line profiles
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Influence of chemical heterogeneities
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Kinematical X-ray scattering theory
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Line profiles caused by planar faults
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Peak profile evaluation for thin films
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Strain broadening of X-ray diffractional peaks
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