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Inside the TOEIC exam /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Inside the TOEIC exam // by Donald Van Metre.
Author:
Van Metre, Donald.
Published:
New York :Kaplan, : 2008.,
[NT 15000922]:
2nd ed.
Description:
xii, 227 p. ;17 cm.;
Subject:
Test of English for International Communication - Study guides. -
ISBN:
9781427797810 (pbk.)
Inside the TOEIC exam /
Van Metre, Donald.
Inside the TOEIC exam /
by Donald Van Metre. - 2nd ed. - New York :Kaplan,2008. - xii, 227 p. ;17 cm.
ISBN: 9781427797810 (pbk.)Subjects--Topical Terms:
421593
Test of English for International Communication
--Study guides.
Dewey Class. No.: 428.0076 / V26
Inside the TOEIC exam /
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421593
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前棟3F一般圖書區(圖書館) 3F General Monographic Collections (Front Building)
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前棟3F一般圖書區(圖書館) 3F General Monographic Collections (Front Building)
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前棟3F一般圖書區(圖書館) 3F General Monographic Collections (Front Building)
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805.1895 M594 2008 c.2
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