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因電子附著所誘發去氧核醣核酸斷裂之密度泛函理論基準研究 = A benc...

廖俐雯

因電子附著所誘發去氧核醣核酸斷裂之密度泛函理論基準研究 = A benchmark study of dft methods for dna strand breaks induced by electron attachment

Record Type:	Language materials, printed : monographic
Paralel Title:	A benchmark study of dft methods for dna strand breaks induced by electron attachment
Author:	廖俐雯,
Place of Publication:	[高雄市]
Published:	[著者];
Year of Publication:	民103[2014]
Description:	107面圖 : 30公分;

因電子附著所誘發去氧核醣核酸斷裂之密度泛函理論基準研究 = A benchmark study of dft methods for dna strand breaks induced by electron attachment
廖, 俐雯

因電子附著所誘發去氧核醣核酸斷裂之密度泛函理論基準研究 = A benchmark study of dft methods for dna strand breaks induced by electron attachment / 廖俐雯(Li-Wenm Liao)撰 - [高雄市] : [著者], 民103[2014]. - 107面 ; 圖 ; 30公分.
含參考書目.

因電子附著所誘發去氧核醣核酸斷裂之密度泛函理論基準研究 = A benchmark study of dft methods for dna strand breaks induced by electron attachment
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200 1 $a 因電子附著所誘發去氧核醣核酸斷裂之密度泛函理論基準研究 $d A benchmark study of dft methods for dna strand breaks induced by electron attachment $f 廖俐雯(Li-Wenm Liao)撰
210 $a [高雄市] $c [著者] $d 民103[2014]
215 0 $a 107面 $c 圖 $d 30公分
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320 $a 含參考書目
328 $a 碩士論文--高雄醫學大學醫藥暨應用化學研究所碩士在職專班
510 1 $a A benchmark study of dft methods for dna strand breaks induced by electron attachment
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